Advanced wafer prober

High And Low Temperature Prober

HLTP-C6/HLTP-C8/HLTP-C12
Product description: wafer prober
INQUIRY

Product Introduction

HLTP-C series prober has an excellent mechanical system, stable structural performance, intuitive, easy operation, support multi-function upgrade, and rich and compre-hensive functions. This product is mainly used in integrated circuits, LED, LCD, solar cells, semiconductor industry manufacturing, and research.

Product Features

1.Innovative air-operated chuck moving platform

2.Liftable micropositioner platform

3.Advanced 3x imaging technology, significantly improving test efficiency

4.Shielded cavity structure design

Product Parameters

Model		HLTP-C6	HLTP-C8	HLTP-C12
Chuck	Size	6inch	8inch	12inch
		205*205mm	205*205mm	305*305mm
	Travel	210mm	210mm	290mm
	Minimum displacement	1μm
EMI shielding		√
Multi-magnification optical system		15:1 three-speed zoom microscope,can display 3 files meanwhile
Temperature control characteristics	Range	-60℃~300℃
	Resolution	0.01℃
	Minimum temperature control rate	±0.1°C/h
	Cooling method	Liquid nitrogen/air