Advanced wafer prober

Failure Analysis Wafer Prober

MDSM-FA-H/MDSM-FA-C
Product description: Wafer Prober
INQUIRY

Product Introduction

MDSM-FA series prober is a measuring equipment specially designed for failure analysis laboratory. It has optical and laser characteristics, stable equipment structure, excellent system performance, intuitive, convenient operation, support multi-function upgrade, and rich and complete product functions.

Product Features

1.Probe card support to improve the efficiency of contacting

2.The chuck can be raised and lowered for quick probe separation from the sample

3.Standard metallographic microscope, Pad test above 1µm

4.Microscope air-controlled lift adjustment

5.Multi-band laser application, fast switching and precise cutting

Product Parameters

Model		MDSM-FA-H	MDSM-FA-C
Chuck	Minimum displacement	1μm	1μm
	Temperature range	RT~300℃	-60℃~300℃
	Pull out quickly	N/A	Travel 290mm
Microscope		Standard PSM-1000 metallographic microscope, which can be magnified to 2000X; The microscope can be adjusted by air control
Laser characteristics	Micromachining capability	1064/532/355/266nm bands can be selected
	power	Output power 2.2mJ/pulse (upgradeable)
	band	Machinable materials: Cr/Al/ITO/Ni/TFT/RGB/Poly Silicon/Mo/SiN/CF impurities, etc.
	precision	The minimum machining accuracy is 1*1μm (with 100X lens)
	cooling method	Choice of air-cooled laser or water-cooled laser
EMI shielding		N/A	√