Quantum Efficiency Tester QE Small Spot Size

Name

Specifications

Sample stage dimensions

230 × 230 mm

Spectral test range

300–1600 nm

Repeatability

≥99.5%

Gold-plated cell test stage

Gold-plated cell test stage, dimensions 230 × 230 mm

1. Gold-plated copper plate with vacuum suction function; designed and fabricated based on customer-provided samples.

2. Supports front-to-back and front-to-front contact testing; designed and fabricated based on customer-provided samples.

Detector

1. Silicon photodiode (300–1100 nm), active area 10 × 10 mm, includes third-party calibration report.

2. Germanium photodiode (900–1600 nm), active area with 10 mm diameter, includes third-party calibration report.

Single light source

1. Xenon lamp light source: 75 W; xenon lamp service life ≥4000 hours.

2. Built-in optical chopper, continuously adjustable frequency (20–1000 Hz).

Monochromator

1. Monochromatic spectral range: 300–2500 nm;

2. Monochromatic light bandwidth: <2 nm;

3. Measurement wavelength interval: Arbitrarily adjustable from 1 to 50 nm;

4. Dual-grating system; monochromator equipped with an 8-position turret.

5. Flat ruled diffraction grating assembly, 1200 lines/mm, 400 nm blaze; wavelength accuracy: ±0.2 nm;

6. Planar ruled diffraction grating assembly, 600 g/mm, 1200 nm blaze, wavelength accuracy: ±0.4 nm;

7. 300 nm long-pass order-sorting filter, 25 mm diameter;

8. 350 nm long-pass order-sorting filter, 25 mm diameter;

9. 470 nm long-pass order-sorting filter, 25 mm diameter;

10. 850 nm long-pass order-sorting filter, 25 mm diameter;

11. 1200 nm long-pass order-sorting filter, 25 mm diameter

Small-spot system

Spot sizes: 1 mm × 1 mm, 3 mm × 3 mm

Other sizes: 1 × 4 mm, 0.6 × 4 mm (narrow slit-like spots)

Polarization system

2 sets of high-power LED light sources (520 nm, 850 nm)

LED light source controller

Software-based automatic control

Bias voltage system

0–10 V bias voltage

Integrating sphere

1. Reflectance and transmittance configuration (IQE testing), equipped with a 50 mm diameter pre-fabricated integrating sphere

2. Equipped with a standard Si detector; measurement range: 300–1150 nm

QE testing software

1. Millennial Solar measurement software: Calibration and generation of test data and plots for SR, EQE, IQE, R (reflectance), and T (transmittance). Supports export of images and CSV files;

2. Real-time EQE display;

3. Calibration report reading;

4. Checkbox-based selection for simultaneous display of multiple datasets;

5. Import of arbitrary AM spectra and calculation of equivalent short-circuit current (Jsc);

6. Auto-save function for real-time data storage, ensuring no data loss during long-duration measurements.

Shielded Test Chamber

Three-layer shielded chamber to prevent noise interference

Test Computer and Accessories

Computer tower, monitor; wireless mouse and keyboard

Name

Specifications

Actual measured spot size

Small spot sizes: 1 mm × 1 mm, 3 mm × 3 mm;

Other sizes: 1 mm × 4 mm, 0.6 mm × 4 mm

Narrow, elongated spot

Repeatability

≤0.5%

Jsc accuracy

Calibration was performed using a standard silicon detector in the range of 300-1100 nm, employing a single-point standard silicon detector

The EQE measurement was conducted a total of 10 times, with the EQE integral Jsc taken, and the Jsc repeatability calculated.

Non-repetitive calculation method: STD/Ave, Jsc non-repetitive <0.3% as required