Advanced wafer prober

MP-E Series manual prober

MP-E4/MP-E6/MP-E8/MP-E12
产品描述：wafer prober
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Product Introduction

The MP-E series is a functionally advanced probe station, which can examine the electrode/pad size of more than 1μm and can upgrade with test functions at a lower cost.

Product Features

1.Chuck can be raised and lowered for quick separation of probe from sample

2.Standard metallographic microscope, Pad test above 1μm.

3.Can be equipped with a laser for FA testing/laser cutting

4.Microscope pneumatic quick lift, easy to change micro-scope and probe card holder

5.POMater Adaptive Isolation Base

6.Adopting shock absorbtion materials imported from Germany to improve test stability

Product Parameters

Manual Prober Model		MP-M4/MP-M6/MP-M6mini	MP-E4/MP-E6/MP-E8/MP-E12	MP-H6/MP-H8/MP-H12
Chuck	Chuck material	Stainless Steel/Nickel or gold plated copper
	Chuck lift	N/A	Quick rise 5mm, fine tune 6mm
	Move quickly	N/A	N/A	√
Micropositioner platform lift		N/A	N/A	Quick lift 5mm,Fine adjustment 40mm,coarse adjustment 300μm
Microscope		Standard body microscope (optional video microscope mirror), can be magnified up to 100X	Standard PSM-1000 metallographic microscope / optional (GX-6 metallographic, stereo, video) microscope,it can be magnified to 2000X，and the microscope can be adjusted up and down by air control
Probe specification	Current leakage	Coaxial 1pA/V @ 25 °C; Three shaft 100fA/V @ 25 °C; Triaxial 10pA@3kv @25°C, Test conditions: dry environment for grounding shield (air dew point lower than -40°C)
	Connector type	Banana head/Alligator clip/Coaxial/Triaxial interface
Test application		DC/(IV, CV) testing Low current (class 100fA) testing 1/f noise test Device Characterization Test WLR, aging test RF test frequency up to 110GHz High power/high current/high voltage test
		/	Failure analysis test	Failure analysis test